Discharging mechanism of pulse signal electric probe conducted by micro-jetting
-
摘要: 针对脉冲信号电探针在微喷射物质作用下出现的“非正常”放电现象,提出了微喷射物质K+Rx等效电路模型,用以解释微喷射物质导通电探针放电机理。开展爆轰实验,联合X射线测试技术,确定了电探针放电区域处于微喷射区与微层裂区的过渡地带,并发现电探针的3类“非正常”放电现象。建立电路仿真模型,将微喷射物质等效成K+Rx电路,调节K+Rx等效电路模型参数,模拟电探针的3类“非正常”放电现象。仿真结果表明,K+Rx等效电路模型很好地解释了微喷射物质作用下脉冲信号电探针的放电机理。Abstract: For the "abnormal discharge" phenomenon of the pulse signal electric probe due to the micro-jetting, we proposed a K+Rx equivalent circuit model of the micro-jetting and conducted the explosive loading experiments to explain the discharging mechanism of the electric probe conducted by the micro-jetting. According to the X-ray testing data, the discharging position of the electric probe obtained was in the transition zone from the micro-jetting to the micro-spall, and the abnormal discharge phenomena of the electric probe were classified into three types. Thus we proposed a circuit simulation model where the micro-jetting is equivalent to a K+Rx circuit. By adjusting the parameters of the K+Rx equivalent circuit model, the three types of the "abnormal discharging" phenomena of the electric probe were simulated. The simulation results show that the K+Rx equivalent circuit model provides an excellent explanation for the discharging of the pulse signal electric probe conducted by the micro-jetting.
-
Key words:
- information processing technology /
- micro-jetting /
- electric probe /
- circuit simulation /
- discharge
-
表 1 电探针信号起跳时间
Table 1. Jump time of electric probe signal
D/mm 第1圈(r=4.0mm) 第2圈(r=7.5mm) 第3圈(r=11.0mm) 测点数 平均起跳时间/μs 测点数 平均起跳时间/μs 测点数 平均起跳时间/μs 25 2 13.45 2 13.60 2 12.12 30 4 16.15 2 16.15 2 16.80 35 2 18.62 4 18.83 4 18.12 40 2 21.14 2 21.70 2 22.10 -
[1] 黄正平.爆炸与冲击电测技术[M].北京:国防工业出版社, 2006:71-106. [2] 金山, 陈永涛, 汤铁钢, 等.多点激光干涉测速系统和电探针技术在飞片速度测量中的应用对比[J].高压物理学报, 2012, 26(5):571-576.Jin Shan, Chen Yongtao, Tang Tiegang, et al. Comparison of multi-channel VISAR and electric probe technology in measuring free-surface velocity of metal flyer[J]. Chinese Journal of High Pressure Physics, 2012, 26(5):571-576. [3] 孙永强, 何智, 王珺.一种高精度爆速测量方法[J].含能材料, 2012, 20(3):329-332. doi: 10.3969/j.issn.1006-9941.2012.03.014Sun Yongqiang, He Zhi, Wang Jun. A precision experimental method of measurement detonation velocity[J]. Chinese Journal of Energetic Materials, 2012, 20(3):329-332. doi: 10.3969/j.issn.1006-9941.2012.03.014 [4] Chen Y, Hu H, Tang T, et al. Experimental study of ejecta from shock melted lead[J]. Journal of Applied Physics, 2012, 111(5):053509. doi: 10.1063/1.3692570 [5] Buttler W T, Oró D M, Olson R T, et al. Second shock ejecta measurements with an explosively driven two-shockwave drive[J]. Journal of Applied Physics, 2014, 116(10):103519. doi: 10.1063/1.4895053 [6] 唐敬友, 伍绍珍, 王藩侯, 等.冲击波加热的氦气与氩气对电探针导通的影响[J].高压物理学报, 2000, 14(4):285-290. doi: 10.3969/j.issn.1000-5773.2000.04.009Tang Jingyou, Wu Shaozhen, Wang Fanhou, et al. The effect of shock-heated gaseous helium and argon on pin shortening[J]. Chinese Journal of High Pressure Physics, 2000, 14(4):285-290. doi: 10.3969/j.issn.1000-5773.2000.04.009 [7] 胡杨, 胡美娥, 张宇红, 等.分布参数与绝缘性变化对脉冲形成网络的影响[J].高能量密度物理, 2014(2):62-67. [8] 胡杨, 胡美娥, 陈永涛, 等.分布参数与绝缘性对电探针脉冲形成电路影响浅析[J].测控技术, 2015, 34(8):5-7. doi: 10.3969/j.issn.1000-8829.2015.08.002Hu Yang, Hu Mei'e, Chen Yongtao, et al. Effect of distribution parameter and insulativity on electric probe pulse-generating circuit[J]. Measurement & Control Technology, 2015, 34(8):5-7. doi: 10.3969/j.issn.1000-8829.2015.08.002 [9] 王为, 王翔.二级轻气炮发射过程中前冲气体的初步研究[J].高压物理学报, 2004, 18(1):94-96. doi: 10.3969/j.issn.1000-5773.2004.01.017Wang Wei, Wang Xiang. Measurement of the precursor gas accompanied with the launch of two-stage gas gun[J]. Chinese Journal of High Pressure Physics, 2004, 18(1):94-96. doi: 10.3969/j.issn.1000-5773.2004.01.017 [10] 王翔, 贾路峰, 傅秋卫, 等.宽脉冲网络信号源及应用[J].高压物理学报, 2005, 19(3):279-283. doi: 10.3969/j.issn.1000-5773.2005.03.015Wang Xiang, Jia Lufeng, Fu Qiuwei, et al. Broad pulse forming circuit and its application[J]. Chinese Journal of High Pressure Physics, 2005, 19(3):279-283. doi: 10.3969/j.issn.1000-5773.2005.03.015