A step-signal electirc probe technology for recognising the front surface of micro-spall
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摘要: 受微喷射物质干扰，现常用的测试技术难以对复杂结构金属样品微层裂前界面进行准确识别，针对该问题提出阶跃信号电探针测试技术。对传统电探针受微喷射物质干扰出现不正常放电现象的原理进行分析，设计阶跃信号形成电路。开展锡金属样品爆轰实验，对比传统电探针和阶跃信号电探针的放电波形，分析阶跃信号电探针数据解读方法，联合X光测试技术，对阶跃信号电探针放电波形阶跃信号高电平出现时刻进行检定。实验结果表明：阶跃信号电探针测试技术能够识别微喷射物质的干扰，可用于爆轰加载下金属样品微层裂前界面的识别。Abstract: Effected by micro-jetting, the usual measuring technologies are hard to recognise the front surface of micro-spall of a metal sample that is of complex structure. In this paper, a step-signal electric-probe measuring technology is proposed to solve this problem. The abnormal discharging phenomenon of the conventional electric probe is analyzed under the effect of micro-jetting and the step-signal producing circuit is designed. Explosive load experiments on Sn metal samples are carried out. The discharging signals of the conventional electric probe and step signal electric probe are compared and the useful information of the step signal is analyzed. Compared to X-ray photograph, we get that the position where the high voltage of step signal responses is the front surface of micro-spall. The results of the experiment show that the step-signal electric probe is able to distinguish the effect of micro-jetting and recognise the front surface of micro-spall of the metal samples under explosive load.
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Key words:
- information processing technology /
- micro-spall /
- electric probe /
- step signal
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图 6 典型阶跃信号电探针和脉冲信号电探针信号数据对比
Figure 6. Comparison between the step-signal electric probe and the impulse-signal ones
图 10 爆轰加载后不同时刻Sn样品的相对体密度分布
Figure 10. Relative volume density distribution of Sn sample driven by detonation at different times
表 1 阶跃信号电探针时间测量结果
Table 1. Time measuring results of step signal electric probe
D/mm 第1圈(r=4 mm) 第2圈(r=7.5 mm) 第3圈(r=11 mm) 测点数 均值/μs 测点数 均值/μs 测点数 均值/μs 25 2 13.24 2 13.76 2 14.06 30 4 16.13 2 16.42 2 16.66 35 2 18.62 4 19.05 4 19.11 40 2 21.43 2 21.84 2 21.80 
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